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TU Delft to Present the Minute DelFly Micro Air Vehicle

On Wednesday 23 July, TU Delft will be presenting the minute DelFly Micro air vehicle. This successor to the DelFly I and II weighs barely 3 grams, and with its flapping wings is very similar to a dragonfly. Ultra-small, remote-controlled micro aircraft with cameras, such as this DelFly, may well be used in the future for observation flights in difficult-to-reach or dangerous areas. The DelFly Micro will make a short demonstration flight during the presentation.

22 Jul 2008

PET-CT Scanner as Stand-Alone Tool to Detect Secondary Cancers

For patients with head and neck cancer, accurately determining how advanced the cancer is and detecting secondary cancers usually means undergoing numerous tests - until now. New Saint Louis University research has found that the PET-CT scanner can be used as a stand-alone tool to detect secondary cancers, which occur in 5 to 10 percent of head and neck cancer patients.

22 Jul 2008

Aurora 1.5Tesla Breast MRI System Now Available to Patients in West Texas

Aurora Imaging Technology Inc. today announced that the Aurora 1.5Tesla Dedicated Breast MRI System is now available to patients in west Texas and its surrounding areas at Wellness Lubbock, a facility dedicated to women's imaging. This is the fifth installation of the Aurora System in the state of Texas, which leads the nation in the number of health care facilities providing this advanced breast imaging technology. The Aurora System is the only Food and Drug Administration (FDA) cleared dedicated breast MRI system specifically designed for the detection, diagnosis and management of breast disease.

21 Jul 2008

Shedding Light on the Secrets of Semiconductor Devices and Cellular Structures

A novel super-resolution X-ray microscope developed by a team of researchers from the Paul Scherrer Institut (PSI) and EPFL in Switzerland combines the high penetration power of x-rays with high spatial resolution, making it possible for the first time to shed light on the detailed interior composition of semiconductor devices and cellular structures.

17 Jul 2008

LV-DAF Offers Large Focus Range and Fast Tracking Ability

Nikon Instruments Inc. announced its new Dynamic Auto-Focus unit, the LV-DAF, bringing fast, versatile auto-focus to the Eclipse LV semiconductor inspection microscope series and OEM applications. Featuring the newly developed Hybrid Auto-Focus system, the LV-DAF offers a large focus range and fast tracking ability through a combination of slit projection and contrast detection auto focus. The result is a highly-versatile system that can be used for a wide range of imaging techniques.

15 Jul 2008

Highly Affordable Multimedia Kit for Moritex's Popular LightScope Industrial Endoscopes

Moritex has introduced a highly affordable Multimedia kit for its popular LightScope industrial endoscopes that includes everything required to perform wide ranging portable inspection and video documentation tasks.

15 Jul 2008

TWINSCAN XT:1950i Enables World-Leading Sub 40 nm Volume Chip Imaging

ASML Holding NV (ASML) announces today its newest TWINSCANTM XT:1950i lithography system using a 1.35 NA lens – increasing the performance of its immersion lithography systems by 25%. The system offers improved overlay, resolution and throughput, to enable high-volume manufacturing of more powerful 38 nanometer (nm) memory and '32' nm logic semiconductors.

15 Jul 2008