Nov 1 2010
Renishaw, manufacturer of laser interferometers, has launched a new laser calibration system, XL-80, that enables a 10X higher data capture rate and a 4X swifter slew rate. The device also allows enhanced system precision in a portable, lighter and compact package.
XL-80 Laser Calibration System
The XL-80 laser calibration system offers nanometer-level motion analysis to error-mapping and calibration of various applications from assembly systems, robots, advanced machine tools, lithography devices, coordinate measuring machines to radiosurgery tools, semi-conductor processing machinery, and lab devices.
The XL-80 has enhanced the linear measurement rate to 4 m/s and offers 1 nm resolution at high speed. Its quick warm up time of less than six minutes reduces the wait to enhance the available measurement time. The XL-80’s signal gain switch provides the choice of 80 m linear range. The device’s system accuracy of ±0.5 ppm is sustained throughout the whole operating range of 0 to 40°C. The XC-80 Intelligent Sensor System sustains the precision against variations in humidity, pressure and temperature.
The XL-80’s ability to take readings at 50 kHZ allows data capture about tiny high-frequency movements. It is backward compatible with optics from the company’s ML10 laser system, allowing numerous ML10 consumers to upgrade to the latest device. All measurements are based on the HeNe laser source’s wavelength. The combined weight of XC-80 compensator and the XL-80 laser device is just above 3 kg including sensors, power supply and connecting cables.
Source: http://www.renishaw.com