STS designs and manufactures a range of highly specialised machines incorporating innovative technology used in the production of semiconductors and semiconductor related devices. Semiconductors, which are miniature electronic circuits, are usually associated with memory chips in computers. However, STS serves a range of applications outside this ‘mainstream’ memory chip market in several emerging sectors within the telecommunications, information technology and new micro electromechanical systems industries.
growth in recent years and have the potential for further growth as demand continues to increase for high technology products such as fibre optic telecommunications networks for Internet infrastructure, high speed wireless communication devices for mobile telephony and a new generation of sensor devices used in the automotive and aerospace industries and other mass markets.
STS is a market leader in silicon etching within the growing MEMS market with patent protected technology. In addition, STS has strong presence in each of its other served markets and distributes its machines world-wide through an experienced sales and service operation consisting of direct sales, distributors and agents.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
This product profile outlines Radiant’s Near-Eye Display Test Solution with Electronic Focus and how XRE lenses are used.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.