SEM-COM Company was formed in 1987 with the purchase of the Owens Illinois (OI)
Glass Technology/Corporate Melting Operations. The OI Glass Technology/Melting
Department dates to 1937, and several of the current SEM-COM employees joined
that OI group in the 1950s. As a result, SEM-COM currently offers decades of combined
experience in the development and manufacture of Specialty Glasses and Glass/Ceramic
Today SEM-COM has more than two hundred (200) active customers worldwide and
several distinct product lines. SEM-COM also has the use of most of the glass
compositions (many proprietary) that were made by OI since 1937. Our composition
database contains over 30,000 glasses which are available for our use in direct
applications or as a basis for new glass development. Depending on the end use
application, our materials move through different manufacturing processes and
find their way into diverse customer products and then to thousands of consumers
throughout the world.
Our core staff of experienced scientists, engineers, and technicians are supported
by some of industry's leading glass technology consultants. This team combination
together with our database provides SEM-COM with the competitive edge.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
This product profile outlines Radiant’s Near-Eye Display Test Solution with Electronic Focus and how XRE lenses are used.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.