Molecular Imprints provides enabling lithography systems and technology for manufacturing applications in: nano-devices, solid state lighting, micro optical components, magenetic and solid state data storage, and semiconductor devices.
Molecular Imprints was founded in Austin, TX, in 2001 to design, develop, manufacture and support imprint lithography systems to be used by semiconductor device and other industry manufacturers. Molecular Imprints is THE largest single organization in the world working solely on imprint lithography.
MII offers a novel technique of lithography and 3-dimensional printing, capable of patterning nano-scale devices and structures. The technique is based on Step and Flash® imprint lithography (S-FIL®) technology that delivers a lower cost, low complexity alternative to expensive optical lithography tools. The patented S-FIL technology is a step and repeat, room temperature, low pressure (<1psi) nano-imprint process that demonstrates sub-20nm resolution.
MII sells to integrated circuit makers, chip makers, and device makers in various markets, including: semiconductor component devices, photonic and optical structures, nano fabrication, advanced packaging, data storage and MEMs/NEMs fabrication.
Molecular Imprints holds, or has filed for, over 400 patent applications worldwide, related to all aspects of S-FIL, including intellectual property in the areas of fluid dispense and control, overlay alignment, template fabrication, and imprint materials.
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.