News - 2 Dec 2009
Veeco Instruments Inc. (Nasdaq: VECO), the leading provider of atomic force microscope (AFM) instrumentation to the Research and Industrial communities, announced today the introduction of two...
News - 10 Nov 2009
Asylum Research, along with Intertech Corporation, Asylum’s representative for Russia, hosted a distinguished group of Russian scientists in late October to discuss the latest advances in AFM...
News - 3 Apr 2008
Veeco Instruments Inc., a leading provider of instrumentation to the nanoscience community, announced today that the prestigious 'Unite mixte de Physique' (UMP), a joint laboratory between the...
Article - 5 Dec 2018
Scanning Spreading Resistance Microscopy (SSRM) is a variation of AFM that employs a conductive tip in contact mode to measure the resistance of a surface in combination with a high force.
Article - 19 Mar 2018
Both AFM & STM are surface microscopy techniques that can determine the topology of a surface & both widely used across chemical & nanoscience fields.
News - 10 Jun 2020
Park Systems, a world-leading innovator in atomic force microscopy (AFM), proudly announces the opening of a new European subsidiary in Nottingham, United Kingdom.
For well over a decade, Park...
News - 11 Dec 2009
Bruker Nano today announced that its N8 TITANOS™ large-sample inspection AFM has been further improved to provide highest spatial resolving power. Due to its unique AFM technology and...
News - 16 Jul 2007
HORIBA Jobin Yvon the world leaders in Raman spectroscopy has announced the launch of its new series of LabRAM Raman microscopes compatible with AFM coupling and integration.
The use of Raman...
Article - 26 Aug 2019
This articles discusses why AFM (atomic force microscopy) is important to scientists.
Article - 15 Mar 2019
AFM has emerged over the last few decades to be a vital tool for measuring the topography and properties of a sample and has vastly expanded its capability over the years.