XE-NSOM Near-Field Scanning Optical Microscope (NSOM) and Raman Spectrometer from Park Systems

The XE-NSOM is specially designed and tailored for advanced optical measurements including Near-field Scanning Optical Microscopy (NSOM) and Raman Spectrometry. The XE-NSOM offers a complete AFM system setup with unprecedented adaptability for these optical experiments. The high-performance Z-servo scanner of the XE-NSOM supports True Non-Contact AFM and utilizes cantilever-based closed-loop feedback technology.

Features

  • Seamless integration of AFM and optical measurements
  • Upgradeable modular design supports AFM, NSOM and Raman Spectroscopy
  • Versatility supporting various reflection/transmission modes
  • Optical head design provides convenient experimental access to the sample
  • Easy alignment of optical axes to the photon detection system

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