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CMOSIS to Demonstrate Ultra-High-Resolution CMOS Industrial Image Sensor at Vision 2011

CMOSIS has announced the introduction of a new ultra-high-resolution CMOS image sensor, the CHR70M, at the Vision 2011 to be held in Stuttgart from 8 to 10 November 2011.

CMOSIS-CHR70M ultra-high-resolution CMOS image sensor

The image sensor provides an image area of 10,000 x 7,096 pixels that possess a 3.1 µm square pixel pitch. At full resolution it provides a 3 fps frame rate. The CHR70M image sensor can be used for PCB and flat-panel inspection, industrial imaging with ultra-high resolution and for scanning of documents.

The CMOS sensor consists of offset regulation, a programmable gain amplifier, and on-chip timing generation features. The image data is transmitted through analog outputs, where each of the eight outputs runs at 30 MHz clock rate. The sensor’s active pinned photodiode pixels that are in a two pixels sharing pattern are designed to avoid artifacts and off-chip calibration, as any such effects will be masked by the CHR70M sensor’s bayer RGB CFA pattern. The pixel readout circuitry has a staggered layout, which makes all pixels display similar angular sensitivity and MTF behavior.

The CHR70M sensor is packaged in ceramic PGA having 65-pins. It works with signaling levels of 3.3 V. CMOSIS will be offering the sensor in multiple versions having a glass cover that has two-sided anti-reflective coating. One version will have a bayer RGB color with microlenses and another will be a B/W that will be offered with and without micro lenses. The CHR70M sensor also provides moving-window functionality. The SPI interface can be used to program the settings and windowing. An on-board sequencer that is programmable can be used to generate all read-out timing and internal exposure values.

Source: http://www.cmosis.com/

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