Using Thermal Cameras for Reliable Thermographic Microscopy

At the same time that the performance of electronic components is being driven ever higher, the need for thermal management at ever smaller scales is also increasing. As a development partner, the Fraunhofer Institute for Silicon Technology (ISIT) supports companies in addressing these growing demands in an optimal fashion. As a result, recent scientific advances can be implemented in new products rapidly, sustaining the fast rate of innovation demanded by the industry. To deal with this challenge, the ISIT, as well as other Fraunhofer Institutes, has a range of innovative technology, which allows its specialists to complete their tasks in the best way possible.

InfraTec’s ImageIR® 8300 Thermal Camera

The ISIT needs to detect the smallest possible temperature differences for the analysis of electronic components. For this purpose, it uses InfraTec’s ImageIR® 8300 thermal camera, which is capable of precisely measuring temperature differences of 20 mK and as a result, securely detecting even just emerging thermal issues. Therefore, development failures can be eliminated at an early stage.

By using a high performance 3x microscopic lens and a detector with (640 x 512) IR pixels at a 15 µm pitch, the ImageIR® 8300 thermal camera can achieve a geometric resolution of only 5 µm. At the same time, it displays a field of view of (3.2 x 2.6) mm2 which is ideally suited for many microelectronic applications. Moreover, easily interchangeable lenses with a range of focal lengths allow the ISIT to further exploit the flexibility of its infrared camera across a range of applications.

Inverter with loaded components to forecast their lifecycle

Inverter with loaded components to forecast their lifecycle

The ISIT also benefits from the precision calibration of the ImageIR® 8300 camera. The use of a set of additional side calibration curves compensates for drift and guarantees the maximum measurement accuracy even under varying measurement conditions. As with all thermographic testings of electronic circuits and components, the differing emissivity of the individual components has an effect on measurements. To address this effect, InfraTec offers an automated pixel-wise emissivity correction routine directly in its control and IRBIS® 3 analysis software. These tools enable making precise statements about temperature distributions and developments over time. With the time component of the heating playing an increasingly important role in the ever-decreasing sizes of components, the ISIT can leverage the multi-kHz frame rates possible with the ImageIR® 8300.

Defective analogue-digital converter with leakage current

Defective analog-digital converter with leakage current

InfraTec GmbH

This information has been sourced, reviewed and adapted from materials provided by InfraTec GmbH.

For more information on this source, please visit InfraTec GmbH.


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