Microscopy News

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Agreement Allows Scientists to Perform Research with an Efficient, Stable and Bright Light Setting

Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, announced today that it has signed a global supply agreement with CoolLED Ltd. to integrate the company's PrecisExcite® LED light source for fluorescence microscopy in its own range of microscopy systems. This will allow scientists to perform their research with an efficient, stable and bright light setting.

28 Aug 2008

Exciting New Developments in Technology Having a Huge Impact on Public Health

Leaders in the field of microscopy from across Ireland will meet at Queen's University Belfast this week to discuss exciting new developments in technology which could have a huge impact on public health.

19 Aug 2008

New Drivers Enable Researchers to Enhance Performance of Microscopy Experiments

Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, today announced the availability of drivers within µManager for their complete range of iXon+ and Luca EMCCD cameras. Within this environment, these drivers offer iCam-optimized acquisition to enable researchers to enhance the performance of microscopy experiments.

13 Aug 2008

$First 3-D Metamaterial Achieving Negative Refractive Index at Optical Frequencies$

First 3-D Metamaterial Achieving Negative Refractive Index at Optical Frequencies

Scientists at the University of California, Berkeley, have for the first time engineered 3-D materials that can reverse the natural direction of visible and near-infrared light, a development that could help form the basis for higher resolution optical imaging, nanocircuits for high-powered computers, and, to the delight of science-fiction and fantasy buffs, cloaking devices that could render objects invisible to the human eye.

11 Aug 2008

A New Type of Scanning Electron Microscope Developed by Hitichi

Hitachi High-Technologies Corporation has developed the SU8000, a new type of Field Emission Scanning Electron Microscope (FE-SEM) that features a newly developed top detector. The SU8000 was introduced on August 1.

7 Aug 2008

Carl Zeiss SMT Introduces ORION PLUS Helium Ion Microscope

At the Microscopy and Microanalysis 2008 meeting and exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT, a leading global provider of electron- and ion-beam imaging and analysis equipment, introduced a new, improved Helium Ion Microscope called the ORION® PLUS.

4 Aug 2008

Third Column Makes NVision 40 Even More Versatile

To enable the production of highly polished TEM lamellas Carl Zeiss SMT now offers an additional Argon ion beam column to its successful NVison 40 CrossBeam workstation.

4 Aug 2008

New Class of SEM Centered on Unique GEMINI Technology

At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a new class of SEM: SIGMA. Growing customer demand for ease of use and class leading X-ray and analytical geometry took center stage when the product was developed.

4 Aug 2008

Carl Zeiss SMT Redesign Vacuum System of LIBRA 120 EFTEM

At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a major upgrade of its LIBRA® 120 Energy Filter Transmission Electron Microscope (EFTEM).

4 Aug 2008

Correlative Microscopy Solution Enables Scientists to Acquire High-Res TEM Images of Molecular Entities

FEI Company, a leading provider of high-resolution imaging and analysis systems, and Max Planck Institute (MPI) of Biochemistry, a leading biochemical research institution, announced today their collaboration on a correlative microscopy solution that enables scientists to quickly and easily acquire high-resolution transmission electron microscope (TEM) images of molecular entities found using optical microscopy techniques.

4 Aug 2008